AFM Training – Tip functions

Post author:Jesus Capistran
Post published:December 12, 2019

Equipment: AFM Bruker Dimension Edge Responsible research: Dr. Francisco Flores Day: 2 Today, I observed how a point for AFM is changed: We need to choose it depending on the material and the measurement we want to perform. For example, today's sample is gold nanoparticles over a glass substrate. Then, we tried the TAP300Al-G, a probe from BudgetSensors. This probe is designed for AFM in Tapping mode and is coated with reflective aluminum. From the company BudgetSensor, we can discover the function of the tip models: No coating: is designed for topography purposes Backside aluminum coating: is designed…

AFM training: Bruker Dimension Edge at IFUAP

Post author:Jesus Capistran
Post published:December 9, 2019

Equipmen: AFM Bruker Dimension Edge Responsible research: Dr. Francisco Flores Day: 1 First training day on AFM Bruker Dimension Edge AFM at the Physics Institute of BUAP. This equipment will allow the measurement of topography properties like roughness and grain size. The researcher in charge explains too that it's possible to acquire electrical conductivity and work function from the surface of the films. URL: Product overview Model: AFM - Bruker Dimension Edge Close up of AFM equipment Connection block card: National Instrument BNC 2110