AFM training: Bruker Dimension Edge at IFUAP

Responsible research: Dr. Francisco Flores 
Day: 1

First training day on AFM Bruker Dimension Edge AFM at the Physics Institute of BUAP. This equipment will allow the measurement of topography properties like roughness and grain size. The researcher in charge explains too that it’s possible to acquire electrical conductivity and work function from the surface of the films. 

Model: AFM – Bruker Dimension Edge 
Close up of AFM equipment
Connection block card: National Instrument BNC 2110 
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Jesus Capistran

Developing thin-film solar cells

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