¿Que estoy leyendo? Información útil para mejorar la presencia online

Post author:Jesus Capistran
Post published:April 28, 2019

Recientemente re-abri mi blog con la intención de construir un perfil acádemico e incluir las lecturas cientificas que realizo de forma periodica para manterme actualizado sobre el desarrollo de materiales semiconductores de película delgada. Redacción del blog y muestra de una anotación realizada de una tesis doctoral sobre desarrollo de kesteritas La idea de compartir la revisión de literatura surge de la experiencia personal en manejo de información del material científicos leído. De forma personal el proceso que yo sigo es el siguiente: Búsqueda de contenido Descargar artículo cientifico y guardar en la computadora Leer con un lector de PDF…

Paper: Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials

Post author:Jesus Capistran
Post published:April 25, 2019

Title: Identifying the Real Minority Carrier Lifetime in Nonideal Semiconductors: A Case Study of Kesterite Materials Authors: Charles J. Hages,* Alex Redinger, Sergiu Levcenko, Hannes Hempel, Mark J. Koeper, Rakesh Agrawal, Dieter Greiner, Christian A. Kaufmann, and Thomas Unold* Link: Adv. Energy Mater. 2017, 1700167 (Cited by 16) Abstract: Time‐resolved photoluminescence (TRPL) is a powerful characterization technique to study carrier dynamics and quantify absorber quality in semiconductors. The minority carrier lifetime, which is critically important for high‐performance solar cells, is often derived from TRPL analysis. However, here it is shown that various nonideal absorber properties can dominate the TRPL signal making reliable extraction of…

Video: Analysis of techniques for measuring carrier recombination lifetime

Post author:Jesus Capistran
Post published:April 24, 2019

Author: Dr. Richard K. Ahrenkiel is a Research Professor of Metallurgical and Materials Engineering at the Colorado School of Mines in Golden, Colorado. Abstract Rapid, accurate and contactless measurement of the recombination lifetime is a very important activity in photovoltaics. The excess carrier lifetime (Δn(t)) is the most critical and variable parameter in the development of photovoltaic materials. Device performance can be accurately predicted from the lifetime measurement of the starting material. However, there is no single measurement that directly measures the bulk lifetime as all measurements are based on a device model. A primary issue is that the lifetime is…