Equipmen: AFM Bruker Dimension Edge  Responsible research: Dr. Francisco Flores  Day: 1 First training day on AFM Bruker Dimension Edge AFM at the Physics Institute of BUAP. This equipment will allow the measurement of topography properties like roughness and grain size. The researcher in charge explains too that it's possible to acquire electrical conductivity and work function from the surface of the films.  URL: Product overview    Model: AFM - Bruker Dimension Edge  Close up of AFM equipment Connection block card: National Instrument BNC 2110