How to Calculate the X-ray Penetration Depth in GIXRD

If you work with thin films and have access to an X-ray diffractometer with grazing incidence capabilities, choosing the right incidence angle is not just a detail, it determines whether you are actually probing your film or the substrate underneath. In this post, I walk through the theory and calculation of the X-ray penetration depth in Grazing Incidence X-ray Diffraction (GIXRD), using SnO$_2$ as a worked example. Why does the incidence angle matter? In a conventional Bragg-Brentano ($\theta$–$2\theta$) XRD measurement, the X-ray beam penetrates several micrometers into the sample. For a thin film of tens or hundreds of nanometers, most…

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My Journey Through Semiconductor Fabrication 101

Discover the fundamentals of semiconductor fabrication with the Semiconductor Fabrication 101 course, a collaboration between Intel, Purdue University, and the University of Texas. Gain hands-on experience through a virtual lab and learn industry-standard processes such as wet etching, oxidation, PECVD, and lithography. Whether you're a student or professional, this free, 15-hour online course is your gateway to understanding how microchips are manufactured, from clean room safety to advanced front-end and back-end processes. Enroll now and earn a prestigious certificate to showcase your skills in semiconductor technology!

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